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 Test and dEpendability of microelectronic integrated SysTems

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Laser Ensemble methods Transient faults Analog signals Simulation Alternate testing Software Soft error Diagnosis Through-silicon vias Integrated circuit design Reliability Phase noise ATPG Fault injection Testing Fault simulation Multiple cell upset MCU Combinational circuits Scan Encryption 1-bit acquisition Particle detector Computer architecture Scan Attacks Countermeasure Process variability Delays Monitoring Indirect testing Logic testing Noise measurement Power demand Approximate computing Protons Memories Computational modeling Cross section Heavy ions BIST OQPSK Approximate Computing Single event upset SEU Power consumption Fault Injection Flip-flops Automatic test pattern generation Fault tolerance FDSOI Integrated circuit reliability Hardware Trojan Security Test Integrated circuit modeling Education Analog/RF integrated circuits Context Saving ZigBee JTAG Switches SER Fiabilité Microprocessors Transient analysis Logic gates Fault attacks Hardware Security Libraries COTS Hardware security Integrated circuit testing Integrated circuits Test and Security Test efficiency Stream Cipher Machine Learning Diffusion model Digital ATE One bit acquisition Atmospheric neutrons Soft errors Radiation Neutrons RF integrated circuits Circuit faults Fault tolerant systems Hardware Machine-learning algorithms Estimation Random access memory Clocks Radiation hardening Digital signal processing RF test Transistors SEU Test cost reduction 3D integration Analytical models Power supplies Microprocessor chips SRAM