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 Test and dEpendability of microelectronic integrated SysTems

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Integrated circuit design Analog signals Hardware Security Test Test and Security Diffusion model Functional and Structural test FDSOI Delays Laser Power demand Monitoring Stream Cipher Multiple cell upset MCU SER Indirect testing Integrated circuit modeling SRAM Diagnosis Integrated circuit reliability Approximate computing 1-bit acquisition Education Scan Encryption Fiabilité Particle detector Software Heavy ions Digital signal processing Power consumption Fault diagnosis Evaluation Dependability Logic gates FRAM Security Cross section Test efficiency FDSOI technology BIST Atmospheric neutrons Digital ATE Fault Injection Transient faults COTS Process variability Protons Estimation Transistors Analog/RF integrated circuits FDSOI Technology Test cost reduction Phase noise Hardware Trojan Clocks Transient analysis SEU Computational modeling Libraries One bit acquisition Noise measurement Microprocessor chips Reliability ATPG 3D integration Fault tolerance Context Saving Hardware Soft errors Hardware security Simulation Data retention Integrated circuit testing Circuit faults Cryptography Radiation Through-silicon vias Testing Microprocessors Fault attacks Power supplies Computer architecture Switches Encryption Random access memory Fault tolerant systems Memories Automatic test pattern generation Fault injection Single event upset SEU Alternate testing Design for testability Fault simulation Databases Flip-flops JTAG Scan Attacks Countermeasure Integrated circuits Logic testing Dynamic test