In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Abstract : The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-01937007
Contributor : Thomas Cornelius <>
Submitted on : Tuesday, November 27, 2018 - 7:13:32 PM
Last modification on : Tuesday, April 2, 2019 - 2:15:02 AM

File

qubs-02-00024.pdf
Publisher files allowed on an open archive

Identifiers

Citation

Anton Davydok, Thomas Cornelius, Zhe Ren, Cédric Leclere, Gilbert Chahine, et al.. In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification. Quantum Beam Science, 2018, 2 (4), ⟨10.3390/qubs2040024⟩. ⟨hal-01937007⟩

Share

Metrics

Record views

258

Files downloads

146