Stable isotopic tracing AFM Kossel diffraction GaMnAs 7550Ee 8140Ef AC susceptibility Evaluation Nuclear reaction analysis RBS Nitridation Indium oxide 18O resonance Alloy Aluminium Silica Adsorbed layers Beta-silicon-carbide Ageing Measurement 2H Atomic transport 7630Lh XPS Nanoparticles 7550Pp Pb centers 18O Auger electron spectroscopy AES Metal-insulator transition Raman spectroscopy Nuclear resonance profiling NRP Epitaxy Nickel Silicon Analyse par faisceaux d'ions Interface defects X-ray diffraction XRD Amorphous carbon Transparent conductive oxide TCO Ion beam analysis Applied physics Gallium oxide Nanostructures Thin films Growth 17O Artificial superlattices Ferromagnetic resonance EPR Capillary condensation Assessment Silicon carbide Epitaxial growth Auger Electron Spectroscopy AES PIXE Atomic Structure Pulsed laser deposition Acoustic propreties of solid 3C-SiC Magnetization curves Density functional theory ADSORPTION DESORPTION HYSTERESIS Backscattering spectrometry Magnetic semiconductors Annealing Ion implantation Magnetic anisotropy Al2O3 Silicon Carbide Energy loss 13C Photoluminescence Passivation Oxygen deficiency Topological insulators Zinc oxide SiC Amorphous silicon nanoparticles Sputtering 6855Jk Acoustic Charge exchange 15N Diffusion Low energy electron diffraction LEED Atomic force microscopy AFM ALD Adsorption Alloys Channeling Oxidation Periodic multilayer Anatase Aluminum Anodizing Rutherford backscattering spectrometry RBS Hysteresis NRP