Amorphous silicon nanoparticles Al2O3 Periodic multilayer Aluminium Annealing 7550Pp Epitaxial growth Acoustic propreties of solid Epitaxy Silicon Ion implantation Measurement Thin films 13C Nanostructures 8140Ef Metal-insulator transition Indium oxide Atomic force microscopy AFM Assessment Photoluminescence Capillary condensation 17O 15N Diffusion Acoustic EPR 18O resonance Hysteresis PIXE Density functional theory Energy loss Alloy Rutherford backscattering spectrometry RBS Nuclear resonance profiling NRP Nuclear reaction analysis Anatase NRP Stable isotopic tracing Silicon carbide 18O Ageing Magnetic semiconductors ADSORPTION DESORPTION HYSTERESIS Transparent conductive oxide TCO 7550Ee Atomic Structure Auger Electron Spectroscopy AES Raman spectroscopy Auger electron spectroscopy AES Nitridation Gallium oxide Silicon Carbide Charge exchange Nickel XRD Zinc oxide GaMnAs ALD 3C-SiC Passivation 7630Lh Ion beam analysis Multilayer RBS AFM Sputtering Atomic Layer Deposition ALD Oxygen deficiency Kossel diffraction Nanoparticles Interface defects Anodizing Atomic transport Pb centers Silica 6855Jk Alloys AC susceptibility Adsorbed layers Topological insulators Low energy electron diffraction LEED Magnetic anisotropy Growth Aluminum SiC Artificial superlattices Applied physics Channeling Pulsed laser deposition Evaluation Amorphous carbon Magnetization curves Oxidation Adsorption XPS Ferromagnetic resonance 2H Analyse par faisceaux d'ions X-ray diffraction