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Nanometric Thin Films : Formation, Interfaces and Defects
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Keywords
Stable isotopic tracing
AFM
Kossel diffraction
GaMnAs
7550Ee
8140Ef
AC susceptibility
Evaluation
Nuclear reaction analysis
RBS
Nitridation
Indium oxide
18O resonance
Alloy
Aluminium
Silica
Adsorbed layers
Beta-silicon-carbide
Ageing
Measurement
2H
Atomic transport
7630Lh
XPS
Nanoparticles
7550Pp
Pb centers
18O
Auger electron spectroscopy AES
Metal-insulator transition
Raman spectroscopy
Nuclear resonance profiling NRP
Epitaxy
Nickel
Silicon
Analyse par faisceaux d'ions
Interface defects
X-ray diffraction
XRD
Amorphous carbon
Transparent conductive oxide TCO
Ion beam analysis
Applied physics
Gallium oxide
Nanostructures
Thin films
Growth
17O
Artificial superlattices
Ferromagnetic resonance
EPR
Capillary condensation
Assessment
Silicon carbide
Epitaxial growth
Auger Electron Spectroscopy AES
PIXE
Atomic Structure
Pulsed laser deposition
Acoustic propreties of solid
3C-SiC
Magnetization curves
Density functional theory
ADSORPTION DESORPTION HYSTERESIS
Backscattering spectrometry
Magnetic semiconductors
Annealing
Ion implantation
Magnetic anisotropy
Al2O3
Silicon Carbide
Energy loss
13C
Photoluminescence
Passivation
Oxygen deficiency
Topological insulators
Zinc oxide
SiC
Amorphous silicon nanoparticles
Sputtering
6855Jk
Acoustic
Charge exchange
15N
Diffusion
Low energy electron diffraction LEED
Atomic force microscopy AFM
ALD
Adsorption
Alloys
Channeling
Oxidation
Periodic multilayer
Anatase
Aluminum
Anodizing
Rutherford backscattering spectrometry RBS
Hysteresis
NRP